Yayın: Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation
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X-ray photoelectron spectroscopy, Nanocrystal, Ion implantation, Sapphire, Annealing (glass), Analytical Chemistry (journal), Amorphous solid, Silicon, Materials science, Binding energy, Secondary ion mass spectrometry, Ion, Chemistry, Crystallography, Nanotechnology, Atomic physics, Chemical engineering, Optoelectronics, Metallurgy