Yayın:
Identification and quantification of reaction phases at Si3N4–Ti interfaces by using analytical transmission electron microscopy techniques

dc.contributor.authorTunçkan, Orkun
dc.contributor.authorYurdakul, Hilmi
dc.contributor.authorTuran, Servet
dc.contributor.orcid0000-0002-5357-5110
dc.contributor.orcid0000-0002-5555-951X
dc.contributor.orcid0000-0002-7322-3091
dc.date.accessioned2025-11-13T10:11:42Z
dc.date.issued2012-07-25
dc.identifier.doihttps://doi.org/10.1016/j.ceramint.2012.07.031
dc.identifier.endpage1095
dc.identifier.issn0272-8842
dc.identifier.issue2
dc.identifier.openalexW1995787484
dc.identifier.startpage1087
dc.identifier.urihttps://hdl.handle.net/11421/3408
dc.identifier.urihttps://doi.org/10.1016/j.ceramint.2012.07.031
dc.identifier.volume39
dc.language.isoen
dc.relation.ispartofCeramics International
dc.rightsrestrictedAccess
dc.subjectMaterials science
dc.subjectTransmission electron microscopy
dc.subjectSilicon nitride
dc.subjectScanning electron microscope
dc.subjectAnalytical Chemistry (journal)
dc.subjectFocused ion beam
dc.subjectEnergy-dispersive X-ray spectroscopy
dc.subjectElectron energy loss spectroscopy
dc.subjectEnergy filtered transmission electron microscopy
dc.subjectSilicon
dc.subjectCeramic
dc.subjectScanning transmission electron microscopy
dc.subjectTitanium
dc.subjectSample preparation
dc.subjectIon
dc.subjectNanotechnology
dc.subjectOptoelectronics
dc.subjectComposite material
dc.subjectMetallurgy
dc.subjectChemistry
dc.subject.sdg7
dc.titleIdentification and quantification of reaction phases at Si3N4–Ti interfaces by using analytical transmission electron microscopy techniques
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5088724102
local.authorid.openalexA5061370006
local.authorid.openalexA5045143436

Dosyalar

Koleksiyonlar