Yayın:
Identification and quantification of reaction phases at Si3N4–Ti interfaces by using analytical transmission electron microscopy techniques

Thumbnail Image

Tarih

2012-07-25

Yazarlar

Dergi Başlığı

Dergi ISSN

Cilt Başlığı

Yayımcı

Araştırma Projeleri

Organizasyon Birimleri

Dergi Sayısı

Özet

Açıklama

Anahtar kelimeler

Materials science, Transmission electron microscopy, Silicon nitride, Scanning electron microscope, Analytical Chemistry (journal), Focused ion beam, Energy-dispersive X-ray spectroscopy, Electron energy loss spectroscopy, Energy filtered transmission electron microscopy, Silicon, Ceramic, Scanning transmission electron microscopy, Titanium, Sample preparation, Ion, Nanotechnology, Optoelectronics, Composite material, Metallurgy, Chemistry

Alıntı

URI

https://hdl.handle.net/11421/3408
 https://doi.org/10.1016/j.ceramint.2012.07.031

Koleksiyonlar

Publications

Endorsement

Review

Supplemented By

Referenced By