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Characterization of Microstructural and Morphological Properties in As-deposited Ta/NiFe/IrMn/CoFe/Ta Multilayer System

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dc.contributor.authorÖksüzoğlu, Ramis Mustafa
dc.contributor.authorYıldırım, Mustafa
dc.contributor.authorÇınar, Hakan
dc.contributor.authorHakan Çınar
dc.contributor.orcid0000-0002-0574-5170
dc.contributor.orcid0000-0001-7657-173X
dc.contributor.orcid0000-0002-8149-6022
dc.date.accessioned2025-11-13T11:45:54Z
dc.date.issued2013-10-26
dc.identifier.doihttps://doi.org/10.1016/j.jmst.2013.10.024
dc.identifier.endpage364
dc.identifier.issn1005-0302
dc.identifier.issue4
dc.identifier.openalexW2003235185
dc.identifier.startpage359
dc.identifier.urihttps://hdl.handle.net/11421/7880
dc.identifier.urihttps://doi.org/10.1016/j.jmst.2013.10.024
dc.identifier.volume30
dc.language.isoen
dc.relation.ispartofJournal of Material Science and Technology
dc.rightsrestrictedAccess
dc.subjectMaterials science
dc.subjectMicrostructure
dc.subjectTexture (cosmology)
dc.subjectSurface roughness
dc.subjectSurface finish
dc.subjectSputter deposition
dc.subjectDislocation
dc.subjectAnisotropy
dc.subjectComposite material
dc.subjectLayer (electronics)
dc.subjectMorphology (biology)
dc.subjectSputtering
dc.subjectCrystallography
dc.subjectThin film
dc.subjectOptics
dc.subjectNanotechnology
dc.subjectChemistry
dc.subject.sdg15
dc.titleCharacterization of Microstructural and Morphological Properties in As-deposited Ta/NiFe/IrMn/CoFe/Ta Multilayer System
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5017619626
local.authorid.openalexA5083570750
local.authorid.openalexA5014164334

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