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Identification of Ti incorporation into β-SiAlON crystal structure through transmission electron microscopy techniques

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dc.contributor.authorYurdakul, Hilmi
dc.contributor.authorTuran, Servet
dc.contributor.orcid0000-0002-5555-951X
dc.contributor.orcid0000-0002-7322-3091
dc.date.accessioned2025-11-13T11:34:47Z
dc.date.issued2012-04-16
dc.identifier.doihttps://doi.org/10.1016/j.ceramint.2012.04.028
dc.identifier.endpage5811
dc.identifier.issn0272-8842
dc.identifier.issue7
dc.identifier.openalexW2080364347
dc.identifier.startpage5807
dc.identifier.urihttps://hdl.handle.net/11421/7263
dc.identifier.urihttps://doi.org/10.1016/j.ceramint.2012.04.028
dc.identifier.volume38
dc.language.isoen
dc.relation.ispartofCeramics International
dc.rightsrestrictedAccess
dc.subjectMaterials science
dc.subjectTransmission electron microscopy
dc.subjectSialon
dc.subjectScanning transmission electron microscopy
dc.subjectTin
dc.subjectScanning electron microscope
dc.subjectElectron energy loss spectroscopy
dc.subjectNanometre
dc.subjectEnergy-dispersive X-ray spectroscopy
dc.subjectCrystal (programming language)
dc.subjectCrystallography
dc.subjectNanotechnology
dc.subjectComposite material
dc.subjectMetallurgy
dc.subjectCeramic
dc.subjectChemistry
dc.subject.sdg7
dc.titleIdentification of Ti incorporation into β-SiAlON crystal structure through transmission electron microscopy techniques
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5061370006
local.authorid.openalexA5045143436

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