Yayın: Identification of Ti incorporation into β-SiAlON crystal structure through transmission electron microscopy techniques
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Materials science, Transmission electron microscopy, Sialon, Scanning transmission electron microscopy, Tin, Scanning electron microscope, Electron energy loss spectroscopy, Nanometre, Energy-dispersive X-ray spectroscopy, Crystal (programming language), Crystallography, Nanotechnology, Composite material, Metallurgy, Ceramic, Chemistry