Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation - Selçuk Yerci; Serincan, U.; İlker Yıldız; Mustafa Kulakcı; U. Serincan; Mario Barozzi; M. Bersani; Raşit Turan (My University, 2007)
Keywords: X-ray photoelectron spectroscopy; Nanocrystal; Ion implantation; Sapphire; Annealing (glass); Analytical Chemistry (journal); Amorphous solid; Silicon; Materials science; Binding energy; Secondary ion mass spectrometry; Ion; Chemistry; Crystallography; Nanotechnology; Atomic physics; Chemical engineering; Optoelectronics; Metallurgy