Identification and quantification of reaction phases at Si3N4–Ti interfaces by using analytical transmission electron microscopy techniques - Orkun Tunçkan; Tunçkan, Orkun; Hilmi Yurdakul; Yurdakul, Hilmi; Servet Turan; Turan, Servet (My University, 2012)
Keywords: Materials science; Transmission electron microscopy; Silicon nitride; Scanning electron microscope; Analytical Chemistry (journal); Focused ion beam; Energy-dispersive X-ray spectroscopy; Electron energy loss spectroscopy; Energy filtered transmission electron microscopy; Silicon; Ceramic; Scanning transmission electron microscopy; Titanium; Sample preparation; Ion; Nanotechnology; Optoelectronics; Composite material; Metallurgy; Chemistry; 7