The timed up and go obstacle test in people with multiple sclerosis: a reliability and validity study - Ahmet Onur Keskin; Çağrı Gülşen; Elvan Özcan Gülşen; Fatih Söke; ÖZCAN GÜLŞEN, ELVAN (Elsevier BV, 2026)
Keywords: Reliability (semiconductor); Test (biology); Obstacle; Multiple sclerosis; Validity