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XPS Studies of Electrodeposited Grown F-Doped ZnO Rods and Electrical Properties of p-Si/n-FZN Heterojunctions

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dc.contributor.authorIlıcan, Saliha
dc.contributor.authorÇağlar, Müjdat
dc.contributor.authorAksoy, Seval
dc.contributor.authorÇağlar, Yasemin
dc.contributor.orcid0000-0001-9724-7664
dc.contributor.orcid0000-0001-8462-0925
dc.date.accessioned2025-11-13T10:04:34Z
dc.date.issued2016-01-01
dc.identifier.doihttps://doi.org/10.1155/2016/6729032
dc.identifier.endpage9
dc.identifier.issn1687-4110
dc.identifier.openalexW2430799236
dc.identifier.startpage1
dc.identifier.urihttps://hdl.handle.net/11421/3044
dc.identifier.urihttps://doi.org/10.1155/2016/6729032
dc.identifier.volume2016
dc.language.isoen
dc.relation.ispartofJournal of Nanomaterials
dc.rightsopenAccess
dc.subjectMaterials science
dc.subjectX-ray photoelectron spectroscopy
dc.subjectDoping
dc.subjectHeterojunction
dc.subjectAnalytical Chemistry (journal)
dc.subjectDiode
dc.subjectThermionic emission
dc.subjectRod
dc.subjectNuclear magnetic resonance
dc.subjectOptoelectronics
dc.subjectPhysics
dc.subjectChemistry
dc.titleXPS Studies of Electrodeposited Grown F-Doped ZnO Rods and Electrical Properties of p-Si/n-FZN Heterojunctions
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5060958239
local.authorid.openalexA5077974474
local.authorid.openalexA5111492712
local.authorid.openalexA5030901812

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