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XRD Raman analysis and optical properties of CuS nanostructured film

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dc.contributor.authorHurma, T.
dc.contributor.authorS. Köse
dc.contributor.orcid0000-0002-8825-7825
dc.contributor.orcid0009-0006-4130-8505
dc.date.accessioned2025-11-13T09:02:29Z
dc.date.issued2016-04-12
dc.identifier.doihttps://doi.org/10.1016/j.ijleo.2016.04.019
dc.identifier.endpage6006
dc.identifier.issn0030-4026
dc.identifier.issue15
dc.identifier.openalexW2338923760
dc.identifier.startpage6000
dc.identifier.urihttps://hdl.handle.net/11421/286
dc.identifier.urihttps://doi.org/10.1016/j.ijleo.2016.04.019
dc.identifier.volume127
dc.language.isoen
dc.relation.ispartofOptik
dc.rightsrestrictedAccess
dc.subjectRaman spectroscopy
dc.subjectMaterials science
dc.subjectRefractive index
dc.subjectCrystallite
dc.subjectAnalytical Chemistry (journal)
dc.subjectTransmittance
dc.subjectMolar absorptivity
dc.subjectSpectroscopy
dc.subjectOptics
dc.subjectOptoelectronics
dc.subjectChemistry
dc.titleXRD Raman analysis and optical properties of CuS nanostructured film
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5026477027

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