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Influence of post-annealing on electrical, structural and optical properties of vanadium oxide thin films

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dc.contributor.authorÖksüzoğlu, Ramis Mustafa
dc.contributor.authorBilgiç, Pınar
dc.contributor.authorYıldırım, Mustafa
dc.contributor.authorDeniz, Okan
dc.contributor.orcid0000-0002-0574-5170
dc.contributor.orcid0000-0002-8149-6022
dc.contributor.orcid0000-0001-8634-8849
dc.date.accessioned2025-11-13T09:24:40Z
dc.date.issued2012-11-07
dc.identifier.doihttps://doi.org/10.1016/j.optlastec.2012.10.001
dc.identifier.endpage109
dc.identifier.issn0030-3992
dc.identifier.openalexW2094298250
dc.identifier.startpage102
dc.identifier.urihttps://hdl.handle.net/11421/1056
dc.identifier.urihttps://doi.org/10.1016/j.optlastec.2012.10.001
dc.identifier.volume48
dc.language.isoen
dc.relation.ispartofOptics & Laser Technology
dc.rightsrestrictedAccess
dc.subjectMaterials science
dc.subjectAnnealing (glass)
dc.subjectVanadium oxide
dc.subjectTemperature coefficient
dc.subjectActivation energy
dc.subjectThin film
dc.subjectAmorphous solid
dc.subjectGrain size
dc.subjectBand gap
dc.subjectElectrical resistance and conductance
dc.subjectAtmospheric temperature range
dc.subjectSheet resistance
dc.subjectElectrical resistivity and conductivity
dc.subjectOxide
dc.subjectAnalytical Chemistry (journal)
dc.subjectComposite material
dc.subjectOptoelectronics
dc.subjectMetallurgy
dc.subjectNanotechnology
dc.subjectCrystallography
dc.subjectChemistry
dc.subject.sdg7
dc.titleInfluence of post-annealing on electrical, structural and optical properties of vanadium oxide thin films
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5017619626
local.authorid.openalexA5069309774
local.authorid.openalexA5083570750
local.authorid.openalexA5004482383

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