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Optical and structural properties of zinc oxide films with different thicknesses prepared by successive ionic layer adsorption and reaction method

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dc.contributor.authorTaner, Ahmet
dc.contributor.authorKul, Metin
dc.contributor.authorAybek, Ahmet Şenol
dc.contributor.authorTuran, Evren
dc.contributor.authorZor, Muhsin
dc.contributor.authorTaşköprü, T.
dc.contributor.orcid0000-0002-6995-6874
dc.contributor.orcid0000-0002-8679-2429
dc.contributor.orcid0000-0002-2112-637X
dc.date.accessioned2025-11-13T10:18:00Z
dc.date.issued2011-04-25
dc.identifier.doihttps://doi.org/10.1016/j.tsf.2011.04.066
dc.identifier.endpage1362
dc.identifier.issn0040-6090
dc.identifier.issue4
dc.identifier.openalexW2031304430
dc.identifier.startpage1358
dc.identifier.urihttps://hdl.handle.net/11421/3730
dc.identifier.urihttps://doi.org/10.1016/j.tsf.2011.04.066
dc.identifier.volume520
dc.language.isoen
dc.relation.ispartofThin Solid Films
dc.rightsrestrictedAccess
dc.subjectCrystallite
dc.subjectAbsorption edge
dc.subjectBand gap
dc.subjectAdsorption
dc.subjectZinc
dc.subjectIonic bonding
dc.subjectTransmission electron microscopy
dc.subjectAnalytical Chemistry (journal)
dc.subjectScanning electron microscope
dc.subjectAbsorption (acoustics)
dc.subjectMaterials science
dc.subjectLayer (electronics)
dc.subjectOxide
dc.subjectDirect and indirect band gaps
dc.subjectDiffraction
dc.subjectChemistry
dc.subjectNanotechnology
dc.subjectOptics
dc.subjectIon
dc.subjectOptoelectronics
dc.subjectComposite material
dc.subjectPhysical chemistry
dc.subjectMetallurgy
dc.subjectOrganic chemistry
dc.titleOptical and structural properties of zinc oxide films with different thicknesses prepared by successive ionic layer adsorption and reaction method
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5059907804
local.authorid.openalexA5012275171
local.authorid.openalexA5047234860
local.authorid.openalexA5090006301
local.authorid.openalexA5103396808
local.authorid.openalexA5010931624

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