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Determination of the thickness and optical constants of transparent indium-doped ZnO thin films by the envelope method

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dc.contributor.authorIlıcan, Saliha
dc.contributor.authorMüjdat Çağlar
dc.contributor.authorYasemin Çağlar
dc.contributor.orcid0000-0001-9724-7664
dc.contributor.orcid0000-0001-8462-0925
dc.date.accessioned2025-11-13T09:15:22Z
dc.date.issued2007-01-01
dc.identifier.openalexW278736460
dc.identifier.urihttps://hdl.handle.net/11421/915
dc.identifier.urihttps://www.materialsscience.pwr.wroc.pl/bi/vol25no3/articles/ms_15ilic.pdf
dc.language.isoen
dc.rightsrestrictedAccess
dc.subjectMaterials science
dc.subjectMolar absorptivity
dc.subjectThin film
dc.subjectRefractive index
dc.subjectTransmittance
dc.subjectWurtzite crystal structure
dc.subjectIndium
dc.subjectAttenuation coefficient
dc.subjectLattice constant
dc.subjectAnalytical Chemistry (journal)
dc.subjectBand gap
dc.subjectOptics
dc.subjectDiffraction
dc.subjectOptoelectronics
dc.subjectChemistry
dc.subjectZinc
dc.subjectNanotechnology
dc.titleDetermination of the thickness and optical constants of transparent indium-doped ZnO thin films by the envelope method
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5060958239

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