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Technophobia Scale Development: Validity and Reliability Study

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dc.contributor.authorGulumbay, Adile Askim
dc.contributor.authorNamlu, Ayşen Gürcan
dc.date.accessioned2025-11-13T21:19:53Z
dc.date.issued2003-01-01
dc.identifier.endpage715
dc.identifier.issue1
dc.identifier.openalexW1576198644
dc.identifier.startpage712
dc.identifier.urihttps://hdl.handle.net/11421/13080
dc.identifier.urihttps://www.learntechlib.org/p/17999/proceedings_17999.pdf
dc.identifier.volume2003
dc.language.isoen
dc.relation.ispartofSociety for Information Technology & Teacher Education International Conference
dc.rightsrestrictedAccess
dc.subjectScale (ratio)
dc.subjectReliability (semiconductor)
dc.subjectPsychology
dc.subjectComputer science
dc.subjectGeography
dc.titleTechnophobia Scale Development: Validity and Reliability Study
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5053730641
local.authorid.openalexA5056731606

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