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The dependence of equilibrium film thickness on grain orientation at interphase boundaries in ceramic–ceramic composites

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dc.contributor.authorTuran, Servet
dc.contributor.authorServet Turan
dc.contributor.orcid0009-0006-1980-0341
dc.contributor.orcid0000-0002-7322-3091
dc.date.accessioned2025-11-13T12:10:48Z
dc.date.issued2000-06-01
dc.identifier.doihttps://doi.org/10.1016/s0304-3991(00)00018-8
dc.identifier.endpage259
dc.identifier.issn0304-3991
dc.identifier.issue3-4
dc.identifier.openalexW2011082354
dc.identifier.startpage245
dc.identifier.urihttps://hdl.handle.net/11421/9210
dc.identifier.urihttps://doi.org/10.1016/s0304-3991(00)00018-8
dc.identifier.volume83
dc.language.isoen
dc.relation.ispartofUltramicroscopy
dc.rightsrestrictedAccess
dc.subjectCeramic
dc.subjectInterphase
dc.subjectMaterials science
dc.subjectComposite material
dc.subjectSilicon carbide
dc.subjectTransmission electron microscopy
dc.subjectBoron nitride
dc.subjectAnisotropy
dc.subjectGrain boundary
dc.subjectAmorphous solid
dc.subjectCarbide
dc.subjectCondensed matter physics
dc.subjectCrystallography
dc.subjectOptics
dc.subjectMicrostructure
dc.subjectNanotechnology
dc.subjectChemistry
dc.subjectPhysics
dc.titleThe dependence of equilibrium film thickness on grain orientation at interphase boundaries in ceramic–ceramic composites
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5045143436

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