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Utilizing Scanning Electron Microscopy Stereoscopy to Explain the Wear Behavior of Latch Needles

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dc.contributor.authorÇukul, Dilek
dc.contributor.authorTuran, Servet
dc.contributor.authorServet Turan
dc.contributor.orcid0000-0003-2007-5758
dc.contributor.orcid0000-0002-7322-3091
dc.date.accessioned2025-11-13T21:23:48Z
dc.date.issued2009-08-26
dc.identifier.doihttps://doi.org/10.1177/0040517509104470
dc.identifier.endpage34
dc.identifier.issn0040-5175
dc.identifier.issue1
dc.identifier.openalexW2153186200
dc.identifier.startpage25
dc.identifier.urihttps://hdl.handle.net/11421/13276
dc.identifier.urihttps://doi.org/10.1177/0040517509104470
dc.identifier.volume80
dc.language.isoen
dc.relation.ispartofTextile Research Journal
dc.rightsrestrictedAccess
dc.subjectScanning electron microscope
dc.subjectYarn
dc.subjectMaterials science
dc.subjectComposite material
dc.subjectStereoscopy
dc.subjectSurface roughness
dc.subjectSurface finish
dc.subjectFiber
dc.subjectHook
dc.subjectComputer science
dc.subjectMechanical engineering
dc.subjectEngineering
dc.subjectArtificial intelligence
dc.titleUtilizing Scanning Electron Microscopy Stereoscopy to Explain the Wear Behavior of Latch Needles
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5087955703
local.authorid.openalexA5045143436

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