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On the structural characterization of InAs/GaSb type-II superlattices: The effect of interfaces for fixed layer thicknesses

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dc.contributor.authorBülent Arıkan
dc.contributor.authorArıkan, Bülent
dc.contributor.authorGüven Korkmaz
dc.contributor.authorAslan, B.
dc.contributor.authorY. Eren Suyolcu
dc.contributor.authorSuyolcu, Y. Eren
dc.contributor.authorB. Aslan
dc.contributor.authorKorkmaz, Güven
dc.contributor.authorU. Serincan
dc.contributor.authorSerincan, U.
dc.contributor.orcid0000-0002-3336-0841
dc.contributor.orcid0000-0003-0988-5194
dc.contributor.orcid0009-0009-7125-7202
dc.contributor.orcid0000-0002-6305-4343
dc.date.accessioned2025-11-13T10:49:10Z
dc.date.issued2013-09-17
dc.identifier.doi10.1016/j.tsf.2013.08.089
dc.identifier.endpage291
dc.identifier.issn0040-6090
dc.identifier.openalexW2075650971
dc.identifier.scopus2-s2.0-84887421508
dc.identifier.startpage288
dc.identifier.urihttps://hdl.handle.net/11421/5351
dc.identifier.urihttps://doi.org/10.1016/j.tsf.2013.08.089
dc.identifier.volume548
dc.identifier.wos000327530300046
dc.language.isoen
dc.relation.ispartofThin Solid Films
dc.rightsrestrictedAccess
dc.subjectSuperlattice
dc.subjectEpitaxy
dc.subjectTransmission electron microscopy
dc.subjectMaterials science
dc.subjectDiffraction
dc.subjectHigh-resolution transmission electron microscopy
dc.subjectHeterojunction
dc.subjectLayer (electronics)
dc.subjectLattice (music)
dc.subjectOptoelectronics
dc.subjectBuffer (optical fiber)
dc.subjectCrystallography
dc.subjectCondensed matter physics
dc.subjectOptics
dc.subjectChemistry
dc.subjectNanotechnology
dc.subjectPhysics
dc.titleOn the structural characterization of InAs/GaSb type-II superlattices: The effect of interfaces for fixed layer thicknesses
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5110542078
local.authorid.openalexA5040309765
local.authorid.openalexA5068483331
local.authorid.openalexA5077095302
local.authorid.openalexA5019428469

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