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Analytical transmission electron microscopy observations on the stability of TiCN in electrically conductive α-β SiAlON/TiCN composites

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dc.contributor.authorAyas, Erhan
dc.contributor.authorTuran, Servet
dc.contributor.authorTunçkan, Orkun
dc.contributor.authorKara, Alpagut
dc.contributor.authorAlpagut Kara
dc.contributor.orcid0000-0002-5555-951X
dc.contributor.orcid0000-0002-7322-3091
dc.contributor.orcid0000-0003-0592-3990
dc.contributor.orcid0000-0002-5357-5110
dc.contributor.orcid0000-0003-0257-406X
dc.date.accessioned2025-11-13T11:19:08Z
dc.date.issued2014-05-01
dc.identifier.doihttps://doi.org/10.1016/j.jeurceramsoc.2014.03.024
dc.identifier.endpage2911
dc.identifier.issn0955-2219
dc.identifier.issue12
dc.identifier.openalexW2077947204
dc.identifier.startpage2905
dc.identifier.urihttps://hdl.handle.net/11421/6409
dc.identifier.urihttps://doi.org/10.1016/j.jeurceramsoc.2014.03.024
dc.identifier.volume34
dc.language.isoen
dc.relation.ispartofJournal of the European Ceramic Society
dc.rightsrestrictedAccess
dc.subjectMaterials science
dc.subjectComposite material
dc.subjectTransmission electron microscopy
dc.subjectSialon
dc.subjectElectrical conductor
dc.subjectElectrically conductive
dc.subjectScanning electron microscope
dc.subjectElectron microscope
dc.subjectCeramic
dc.subjectNanotechnology
dc.subjectOptics
dc.titleAnalytical transmission electron microscopy observations on the stability of TiCN in electrically conductive α-β SiAlON/TiCN composites
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5039658839
local.authorid.openalexA5045143436
local.authorid.openalexA5088724102
local.authorid.openalexA5085006420

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