Yayın: Structural, optical and electrical characterization of InAs0.83Sb0.17 p-π-n photodetector grown on GaAs substrate
| dc.contributor.author | Erkuş, Mehmet | |
| dc.contributor.author | Şenel, Oytun Okan | |
| dc.contributor.author | Serincan, U. | |
| dc.contributor.orcid | 0000-0001-6205-8628 | |
| dc.contributor.orcid | 0000-0002-9008-9437 | |
| dc.contributor.orcid | 0000-0002-6305-4343 | |
| dc.date.accessioned | 2025-11-13T11:35:28Z | |
| dc.date.issued | 2016-08-09 | |
| dc.identifier.doi | https://doi.org/10.1016/j.tsf.2016.08.011 | |
| dc.identifier.endpage | 144 | |
| dc.identifier.issn | 0040-6090 | |
| dc.identifier.openalex | W2517996878 | |
| dc.identifier.startpage | 141 | |
| dc.identifier.uri | https://hdl.handle.net/11421/7302 | |
| dc.identifier.uri | https://doi.org/10.1016/j.tsf.2016.08.011 | |
| dc.identifier.volume | 616 | |
| dc.language.iso | en | |
| dc.relation.ispartof | Thin Solid Films | |
| dc.rights | restrictedAccess | |
| dc.subject | Molecular beam epitaxy | |
| dc.subject | Dark current | |
| dc.subject | Photodetector | |
| dc.subject | Optoelectronics | |
| dc.subject | Materials science | |
| dc.subject | Substrate (aquarium) | |
| dc.subject | Wavelength | |
| dc.subject | Quantum efficiency | |
| dc.subject | Infrared | |
| dc.subject | Arrhenius plot | |
| dc.subject | Optics | |
| dc.subject | Epitaxy | |
| dc.subject | Chemistry | |
| dc.subject | Layer (electronics) | |
| dc.subject | Activation energy | |
| dc.subject | Physics | |
| dc.subject.sdg | 7 | |
| dc.title | Structural, optical and electrical characterization of InAs0.83Sb0.17 p-π-n photodetector grown on GaAs substrate | |
| dc.type | Article | |
| dspace.entity.type | Publication | |
| local.authorid.openalex | A5056430509 | |
| local.authorid.openalex | A5011930276 | |
| local.authorid.openalex | A5019428469 |
