Yayın: Towards atomic scale engineering of rare-earth-doped SiAlON ceramics through aberration-corrected scanning transmission electron microscopy
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Sialon, Materials science, Transmission electron microscopy, Scanning transmission electron microscopy, Scanning electron microscope, Atomic units, Doping, Hexagonal crystal system, Ceramic, Rare earth, Nanotechnology, Mineralogy, Crystallography, Optoelectronics, Composite material, Metallurgy, Chemistry, Physics