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Dependence of photostriction on sample thickness and surface roughness for PLZT ceramics

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dc.contributor.authorDogan, A.
dc.contributor.authorA. Dogan
dc.contributor.authorS. Thakoor
dc.contributor.authorKenji Uchino
dc.contributor.orcid0000-0002-8122-2996
dc.contributor.orcid0000-0003-1651-7912
dc.date.accessioned2025-11-13T11:42:06Z
dc.date.issued2002-11-22
dc.identifier.doihttps://doi.org/10.1109/ultsym.1997.663082
dc.identifier.openalexW2168484857
dc.identifier.urihttps://hdl.handle.net/11421/7677
dc.identifier.urihttps://doi.org/10.1109/ultsym.1997.663082
dc.language.isoen
dc.rightsrestrictedAccess
dc.subjectMaterials science
dc.subjectCeramic
dc.subjectActuator
dc.subjectSurface roughness
dc.subjectSurface finish
dc.subjectComposite material
dc.subjectFerroelectric ceramics
dc.subjectFerroelectricity
dc.subjectPhotovoltaic system
dc.subjectOptoelectronics
dc.subjectDielectric
dc.subjectComputer science
dc.subjectElectrical engineering
dc.titleDependence of photostriction on sample thickness and surface roughness for PLZT ceramics
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5100676005

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