Yayın:
Developing an Effective Lifelong Learning Scale (ELLS): Study of Validity & Reliability

Sadeleştirilmiş öğe sayfası
dc.contributor.authorSelim Günüç
dc.contributor.authorHatice Ferhan Odabaşı
dc.contributor.authorAbdullah Kuzu
dc.contributor.orcid0000-0002-2278-7882
dc.contributor.orcid0000-0003-4362-4609
dc.contributor.orcid0000-0002-1030-0424
dc.date.accessioned2026-05-20T09:46:58Z
dc.date.issued2014-02-01
dc.identifier.doi10.15390/es.2014.1230
dc.identifier.endpage258
dc.identifier.issn1300-1337
dc.identifier.issue171
dc.identifier.openalexW4415907097
dc.identifier.startpage244
dc.identifier.urihttps://hdl.handle.net/11421/38763
dc.identifier.urihttps://doi.org/10.15390/es.2014.1230
dc.identifier.volume39
dc.relation.ispartofTED EĞİTİM VE BİLİM
dc.rightsopenAccess
dc.subjectReliability (semiconductor)
dc.subjectScale (ratio)
dc.subjectLifelong learning
dc.subjectCronbach's alpha
dc.subjectValidity
dc.titleDeveloping an Effective Lifelong Learning Scale (ELLS): Study of Validity & Reliability
dspace.entity.typePublication

Dosyalar

Koleksiyonlar

Publications