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Fourier transform infrared and Raman spectroscopic properties of Cd<sub>1</sub><sub><i>-x</i></sub>Sb<sub><i>x</i></sub>S films deposited by ultrasonic spray pyrolysis

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dc.contributor.authorÖzer, T.
dc.contributor.authorAksay, Sabiha
dc.contributor.authorS. Köse
dc.contributor.orcid0009-0006-4130-8505
dc.date.accessioned2025-11-13T11:21:47Z
dc.date.issued2010-06-16
dc.identifier.doihttps://doi.org/10.1051/epjap/2010077
dc.identifier.endpage11501
dc.identifier.issn1286-0042
dc.identifier.issue1
dc.identifier.openalexW2094426865
dc.identifier.startpage11501
dc.identifier.urihttps://hdl.handle.net/11421/6550
dc.identifier.urihttps://doi.org/10.1051/epjap/2010077
dc.identifier.volume51
dc.language.isoen
dc.relation.ispartofThe European Physical Journal Applied Physics
dc.rightsrestrictedAccess
dc.subjectRaman spectroscopy
dc.subjectCrystallite
dc.subjectAntimony
dc.subjectMaterials science
dc.subjectAnalytical Chemistry (journal)
dc.subjectInfrared
dc.subjectFourier transform infrared spectroscopy
dc.subjectDoping
dc.subjectInfrared spectroscopy
dc.subjectThin film
dc.subjectCrystallography
dc.subjectChemistry
dc.subjectOptics
dc.subjectNanotechnology
dc.subjectOrganic chemistry
dc.subjectMetallurgy
dc.subject.sdg6
dc.titleFourier transform infrared and Raman spectroscopic properties of Cd<sub>1</sub><sub><i>-x</i></sub>Sb<sub><i>x</i></sub>S films deposited by ultrasonic spray pyrolysis
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5113567511
local.authorid.openalexA5062041712

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