Yayın: EBSD Characterisation of SPSed CeB 6 Thermionic Electron Emitter
| dc.contributor.author | Başkut, Sinem | |
| dc.contributor.author | Ayas, Erhan | |
| dc.contributor.author | Köroğlu, Levent | |
| dc.contributor.author | Turan, Servet | |
| dc.contributor.orcid | 0000-0002-2584-0220 | |
| dc.contributor.orcid | 0000-0003-4696-1459 | |
| dc.contributor.orcid | 0000-0003-0592-3990 | |
| dc.contributor.orcid | 0000-0002-7322-3091 | |
| dc.date.accessioned | 2025-11-13T22:50:13Z | |
| dc.date.issued | 2016-07-01 | |
| dc.identifier.doi | https://doi.org/10.1017/s1431927616010230 | |
| dc.identifier.endpage | 1879 | |
| dc.identifier.issn | 1431-9276 | |
| dc.identifier.issue | S3 | |
| dc.identifier.openalex | W2559803422 | |
| dc.identifier.startpage | 1878 | |
| dc.identifier.uri | https://hdl.handle.net/11421/15472 | |
| dc.identifier.uri | https://doi.org/10.1017/s1431927616010230 | |
| dc.identifier.volume | 22 | |
| dc.language.iso | en | |
| dc.relation.ispartof | Microscopy and Microanalysis | |
| dc.rights | openAccess | |
| dc.subject | Electron backscatter diffraction | |
| dc.subject | Common emitter | |
| dc.subject | Materials science | |
| dc.subject | Thermionic emission | |
| dc.subject | Electron | |
| dc.subject | Engineering physics | |
| dc.subject | Optoelectronics | |
| dc.subject | Composite material | |
| dc.subject | Physics | |
| dc.subject | Nuclear physics | |
| dc.title | EBSD Characterisation of SPSed CeB 6 Thermionic Electron Emitter | |
| dc.type | Article | |
| dspace.entity.type | Publication | |
| local.authorid.openalex | A5017398727 | |
| local.authorid.openalex | A5039658839 | |
| local.authorid.openalex | A5080969383 | |
| local.authorid.openalex | A5045143436 |
