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A comparative device performance assesment of CVD grown MoS2 and WS2 monolayers

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dc.contributor.authorŞar, Hüseyin
dc.contributor.authorSevik, Cem
dc.contributor.authorPerkgöz, Nihan Kosku
dc.contributor.authorÖzden, Ayberk
dc.contributor.authorYorulmaz, Büşra
dc.contributor.authorAy, Feridun
dc.contributor.orcid0000-0002-4993-1258
dc.contributor.orcid0000-0002-4701-0201
dc.contributor.orcid0000-0002-2412-9672
dc.contributor.orcid0000-0003-1331-0959
dc.contributor.orcid0000-0003-2255-1156
dc.date.accessioned2025-11-13T09:44:38Z
dc.date.issued2018-03-15
dc.identifier.doihttps://doi.org/10.1007/s10854-018-8895-5
dc.identifier.endpage8792
dc.identifier.issn0957-4522
dc.identifier.issue10
dc.identifier.openalexW2794439646
dc.identifier.startpage8785
dc.identifier.urihttps://hdl.handle.net/11421/2059
dc.identifier.urihttps://doi.org/10.1007/s10854-018-8895-5
dc.identifier.volume29
dc.language.isoen
dc.relation.ispartofJournal of Materials Science Materials in Electronics
dc.rightsrestrictedAccess
dc.subjectPhotodetector
dc.subjectMaterials science
dc.subjectOptoelectronics
dc.subjectTransistor
dc.subjectMonolayer
dc.subjectFabrication
dc.subjectSubstrate (aquarium)
dc.subjectChemical vapor deposition
dc.subjectHysteresis
dc.subjectElectron mobility
dc.subjectField-effect transistor
dc.subjectNanotechnology
dc.subjectVoltage
dc.subjectElectrical engineering
dc.subject.sdg7
dc.titleA comparative device performance assesment of CVD grown MoS2 and WS2 monolayers
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5089586117
local.authorid.openalexA5005966345
local.authorid.openalexA5025184803
local.authorid.openalexA5045989000
local.authorid.openalexA5077428799
local.authorid.openalexA5059641863

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