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AI-Enhanced Distractors and Test Quality

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dc.contributor.authorBelgin Boz Yüksekdağ
dc.contributor.authorNejdet Karadağ
dc.contributor.authorMurat Akyıldız
dc.contributor.authorMesut Aydemir
dc.contributor.authorAras Bozkurt
dc.contributor.orcid0000-0003-2862-3544
dc.contributor.orcid0000-0002-9826-1297
dc.contributor.orcid0000-0002-2035-1292
dc.date.accessioned2026-05-20T10:20:00Z
dc.date.issued2026-03-04
dc.identifier.doi10.17632/45dv52zf7f.1
dc.identifier.openalexW7133557608
dc.identifier.urihttps://hdl.handle.net/11421/39788
dc.identifier.urihttps://doi.org/10.17632/45dv52zf7f.1
dc.relation.ispartofMendeley Data
dc.rightsopenAccess
dc.subjectComparability
dc.subjectReliability (semiconductor)
dc.subjectTest (biology)
dc.subjectDysfunctional family
dc.subjectQuality (philosophy)
dc.subjectItem response theory
dc.subjectPsychometrics
dc.titleAI-Enhanced Distractors and Test Quality
dspace.entity.typePublication

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