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XRD RAMAN AND Uv-vis SPECTROSCOPICAL ANALYSIS OF NANOSTRUCTURED CdS:Li FILMS

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dc.contributor.authorHurma, T.
dc.contributor.orcid0000-0002-8825-7825
dc.date.accessioned2025-11-13T22:54:47Z
dc.date.issued2017-12-26
dc.identifier.doihttps://doi.org/10.18038/aubtda.333956
dc.identifier.endpage1
dc.identifier.issn1302-3160
dc.identifier.openalexW2781117450
dc.identifier.startpage1
dc.identifier.urihttps://hdl.handle.net/11421/15722
dc.identifier.urihttps://doi.org/10.18038/aubtda.333956
dc.language.isoen
dc.relation.ispartofAnadolu University Journal of Science and Technology-A Applied Sciences and Engineering
dc.rightsopenAccess
dc.subjectRaman spectroscopy
dc.subjectCrystallite
dc.subjectMaterials science
dc.subjectBand gap
dc.subjectLithium (medication)
dc.subjectCrystallization
dc.subjectAnalytical Chemistry (journal)
dc.subjectChemical engineering
dc.subjectOptics
dc.subjectChemistry
dc.subjectOptoelectronics
dc.subjectMetallurgy
dc.subjectOrganic chemistry
dc.subject.sdg7
dc.titleXRD RAMAN AND Uv-vis SPECTROSCOPICAL ANALYSIS OF NANOSTRUCTURED CdS:Li FILMS
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5026477027

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