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2k Factorial Experiments in Reliability Analysis for Weibull and log-normal Distributions

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dc.contributor.authorOmondi, Beldine
dc.contributor.authorBeldine Omondi
dc.contributor.orcid0000-0001-9843-7355
dc.contributor.orcid0000-0001-8607-6062
dc.date.accessioned2025-11-13T20:36:46Z
dc.date.issued2021-04-15
dc.identifier.doihttps://doi.org/10.47933/ijeir.826795
dc.identifier.endpage120
dc.identifier.issn2687-2153
dc.identifier.issue2
dc.identifier.openalexW3156598016
dc.identifier.startpage115
dc.identifier.urihttps://hdl.handle.net/11421/12388
dc.identifier.urihttps://doi.org/10.47933/ijeir.826795
dc.identifier.volume3
dc.language.isoen
dc.relation.ispartofInternational Journal of Engineering and Innovative Research
dc.rightsopenAccess
dc.subjectWeibull distribution
dc.subjectReliability (semiconductor)
dc.subjectReliability engineering
dc.subjectFactorial experiment
dc.subjectFractional factorial design
dc.subjectStatistics
dc.subjectFactorial
dc.subjectAccelerated life testing
dc.subjectDesign of experiments
dc.subjectMathematics
dc.subjectProduct (mathematics)
dc.subjectPower (physics)
dc.subjectComputer science
dc.subjectEngineering
dc.subject.sdg12
dc.title2k Factorial Experiments in Reliability Analysis for Weibull and log-normal Distributions
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5050047844

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