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XRD, SEM, XPS studies of Sb doped ZnO films and electrical properties of its based Schottky diodes

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dc.contributor.authorÇağlar, Yasemin
dc.contributor.authorÇağlar, Müjdat
dc.contributor.authorIlıcan, Saliha
dc.contributor.orcid0000-0001-8462-0925
dc.contributor.orcid0000-0001-9724-7664
dc.date.accessioned2025-11-13T09:24:34Z
dc.date.issued2018-03-10
dc.identifier.doihttps://doi.org/10.1016/j.ijleo.2018.03.017
dc.identifier.endpage432
dc.identifier.issn0030-4026
dc.identifier.openalexW2789720015
dc.identifier.startpage424
dc.identifier.urihttps://hdl.handle.net/11421/1050
dc.identifier.urihttps://doi.org/10.1016/j.ijleo.2018.03.017
dc.identifier.volume164
dc.language.isoen
dc.relation.ispartofOptik
dc.rightsrestrictedAccess
dc.subjectMaterials science
dc.subjectSchottky diode
dc.subjectX-ray photoelectron spectroscopy
dc.subjectSchottky barrier
dc.subjectDoping
dc.subjectThermionic emission
dc.subjectScanning electron microscope
dc.subjectCrystallite
dc.subjectDiode
dc.subjectOptoelectronics
dc.subjectAnalytical Chemistry (journal)
dc.subjectChemical engineering
dc.subjectElectron
dc.subjectComposite material
dc.subjectChemistry
dc.subjectMetallurgy
dc.titleXRD, SEM, XPS studies of Sb doped ZnO films and electrical properties of its based Schottky diodes
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5030901812
local.authorid.openalexA5077974474
local.authorid.openalexA5060958239

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