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Structural investigation on InAs/GaSb thin films

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dc.contributor.authorGuzel, Ayse Seray
dc.contributor.authorKılıç, A.
dc.contributor.authorErgün, Y.
dc.contributor.authorC. Tükel
dc.contributor.authorShigeaki Ide
dc.contributor.authorY. Ergün
dc.contributor.orcid0000-0002-3595-9778
dc.contributor.orcid0000-0001-6816-1108
dc.date.accessioned2025-11-13T22:46:53Z
dc.date.issued2011-08-22
dc.identifier.doihttps://doi.org/10.1107/s0108767311094086
dc.identifier.endpageC237
dc.identifier.issn0108-7673
dc.identifier.issuea1
dc.identifier.openalexW2322889455
dc.identifier.startpageC237
dc.identifier.urihttps://hdl.handle.net/11421/15290
dc.identifier.urihttps://doi.org/10.1107/s0108767311094086
dc.identifier.volume67
dc.language.isoen
dc.relation.ispartofActa Crystallographica Section A Foundations of Crystallography
dc.rightsopenAccess
dc.subjectMaterials science
dc.subjectOptoelectronics
dc.subjectThin film
dc.subjectNanotechnology
dc.titleStructural investigation on InAs/GaSb thin films
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5020809759
local.authorid.openalexA5048111215
local.authorid.openalexA5086818203

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