Yayın: Microstructural, optical and electrical studies on sol gel derived ZnO and ZnO:Al films
| dc.contributor.author | Çağlar, Yasemin | |
| dc.contributor.author | Çağlar, Müjdat | |
| dc.contributor.author | Ilıcan, Saliha | |
| dc.contributor.orcid | 0000-0001-8462-0925 | |
| dc.contributor.orcid | 0000-0001-9724-7664 | |
| dc.date.accessioned | 2025-11-13T09:05:06Z | |
| dc.date.issued | 2011-12-29 | |
| dc.identifier.doi | https://doi.org/10.1016/j.cap.2011.12.017 | |
| dc.identifier.endpage | 968 | |
| dc.identifier.issn | 1567-1739 | |
| dc.identifier.issue | 3 | |
| dc.identifier.openalex | W2006989597 | |
| dc.identifier.startpage | 963 | |
| dc.identifier.uri | https://hdl.handle.net/11421/405 | |
| dc.identifier.uri | https://doi.org/10.1016/j.cap.2011.12.017 | |
| dc.identifier.volume | 12 | |
| dc.language.iso | en | |
| dc.relation.ispartof | Current Applied Physics | |
| dc.rights | restrictedAccess | |
| dc.subject | Materials science | |
| dc.subject | Dopant | |
| dc.subject | Spin coating | |
| dc.subject | Absorption edge | |
| dc.subject | Band gap | |
| dc.subject | Doping | |
| dc.subject | Field emission microscopy | |
| dc.subject | Scanning electron microscope | |
| dc.subject | Transmittance | |
| dc.subject | Thin film | |
| dc.subject | Electrical resistivity and conductivity | |
| dc.subject | Diffraction | |
| dc.subject | Analytical Chemistry (journal) | |
| dc.subject | Optoelectronics | |
| dc.subject | Optics | |
| dc.subject | Nanotechnology | |
| dc.subject | Composite material | |
| dc.subject | Chemistry | |
| dc.subject.sdg | 7 | |
| dc.title | Microstructural, optical and electrical studies on sol gel derived ZnO and ZnO:Al films | |
| dc.type | Article | |
| dspace.entity.type | Publication | |
| local.authorid.openalex | A5030901812 | |
| local.authorid.openalex | A5077974474 | |
| local.authorid.openalex | A5060958239 |
