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Structural and electrical analysis of poly-Ge films fabricated by e-beam evaporation for optoelectronic applications

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dc.contributor.authorKulakcı, Mustafa
dc.contributor.authorMustafa Kulakcı
dc.contributor.authorRaşit Turan
dc.contributor.orcid0000-0003-4117-7710
dc.contributor.orcid0000-0003-3857-5814
dc.contributor.orcid0000-0002-2612-8972
dc.date.accessioned2025-11-13T10:14:22Z
dc.date.issued2016-10-01
dc.identifier.doihttps://doi.org/10.1016/j.mssp.2016.09.023
dc.identifier.endpage372
dc.identifier.issn1369-8001
dc.identifier.openalexW2524734551
dc.identifier.startpage368
dc.identifier.urihttps://hdl.handle.net/11421/3546
dc.identifier.urihttps://doi.org/10.1016/j.mssp.2016.09.023
dc.identifier.volume56
dc.language.isoen
dc.relation.ispartofMaterials Science in Semiconductor Processing
dc.rightsopenAccess
dc.subjectMaterials science
dc.subjectAnnealing (glass)
dc.subjectCrystallization
dc.subjectRaman spectroscopy
dc.subjectAmorphous solid
dc.subjectElectron beam physical vapor deposition
dc.subjectThin film
dc.subjectOptoelectronics
dc.subjectNanotechnology
dc.subjectCrystallography
dc.subjectChemical engineering
dc.subjectComposite material
dc.subjectOptics
dc.titleStructural and electrical analysis of poly-Ge films fabricated by e-beam evaporation for optoelectronic applications
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5079581241

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