Yayın: Sentinel-2 Pan Sharpening—Comparative Analysis
| dc.contributor.author | Kaplan, Gordana | |
| dc.contributor.orcid | 0000-0001-7522-9924 | |
| dc.date.accessioned | 2025-11-13T09:32:19Z | |
| dc.date.issued | 2018-03-22 | |
| dc.identifier.doi | https://doi.org/10.3390/ecrs-2-05158 | |
| dc.identifier.openalex | W2789782027 | |
| dc.identifier.uri | https://hdl.handle.net/11421/1421 | |
| dc.identifier.uri | https://doi.org/10.3390/ecrs-2-05158 | |
| dc.language.iso | en | |
| dc.rights | openAccess | |
| dc.subject | Panchromatic film | |
| dc.subject | Multispectral image | |
| dc.subject | Sharpening | |
| dc.subject | Image resolution | |
| dc.subject | Image fusion | |
| dc.subject | Spectral bands | |
| dc.subject | Remote sensing | |
| dc.subject | Computer science | |
| dc.subject | Artificial intelligence | |
| dc.subject | Geography | |
| dc.subject | Image (mathematics) | |
| dc.title | Sentinel-2 Pan Sharpening—Comparative Analysis | |
| dc.type | Article | |
| dspace.entity.type | Publication | |
| local.authorid.openalex | A5040360045 |
