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EFFECT OF THICKNESS ON THE STRUCTURAL, MICROSTRUCTURAL, ELECTRICAL AND MAGNETIC PROPERTIES OF Ni FILMS ELABORATED BY PULSED ELECTRODEPOSITION ON Si SUBSTRATE

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dc.contributor.authorÖksüzoğlu, Ramis Mustafa
dc.contributor.authorDirican, Emrah
dc.contributor.authorM. Hemmous
dc.contributor.authorEmrah Dirican
dc.contributor.authorRamis Mustafa Öksüzoğlu
dc.contributor.authorA. Azizi
dc.contributor.authorA. Laggoun
dc.contributor.authorM. Zergoug
dc.contributor.orcid0000-0002-1145-1187
dc.contributor.orcid0000-0002-0574-5170
dc.contributor.orcid0009-0000-9728-9928
dc.date.accessioned2025-11-13T10:21:54Z
dc.date.issued2017-06-02
dc.identifier.doihttps://doi.org/10.1142/s0218625x18500580
dc.identifier.endpage1850058
dc.identifier.issn0218-625X
dc.identifier.issue02
dc.identifier.openalexW2620979264
dc.identifier.startpage1850058
dc.identifier.urihttps://hdl.handle.net/11421/3925
dc.identifier.urihttps://doi.org/10.1142/s0218625x18500580
dc.identifier.volume25
dc.language.isoen
dc.relation.ispartofSurface Review and Letters
dc.rightsrestrictedAccess
dc.subjectMaterials science
dc.subjectCrystallite
dc.subjectElectrical resistivity and conductivity
dc.subjectThin film
dc.subjectTexture (cosmology)
dc.subjectGrain size
dc.subjectCrystallography
dc.subjectAnalytical Chemistry (journal)
dc.subjectCondensed matter physics
dc.subjectPhysics
dc.subjectNanotechnology
dc.subjectComposite material
dc.subjectChemistry
dc.subjectMetallurgy
dc.subjectImage (mathematics)
dc.subjectQuantum mechanics
dc.titleEFFECT OF THICKNESS ON THE STRUCTURAL, MICROSTRUCTURAL, ELECTRICAL AND MAGNETIC PROPERTIES OF Ni FILMS ELABORATED BY PULSED ELECTRODEPOSITION ON Si SUBSTRATE
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5017619626
local.authorid.openalexA5091251775

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