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Microstructure–property relationship in textured ZnO-based varistors

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dc.contributor.authorİ. Özgür Özer
dc.contributor.authorÖzer, İ. Özgür
dc.contributor.authorEnder Suvacı
dc.contributor.authorSuvacı, Ender
dc.contributor.authorSlavko Bernik
dc.contributor.orcid0000-0002-3755-1389
dc.contributor.orcid0000-0002-2635-4822
dc.contributor.orcid0000-0001-7330-3094
dc.date.accessioned2025-11-13T10:09:21Z
dc.date.issued2010-05-06
dc.identifier.doi10.1016/j.actamat.2010.04.003
dc.identifier.endpage4136
dc.identifier.issn1359-6454
dc.identifier.issue12
dc.identifier.openalexW1965744013
dc.identifier.scopus2-s2.0-79960919387
dc.identifier.startpage4126
dc.identifier.urihttps://hdl.handle.net/11421/3293
dc.identifier.urihttps://doi.org/10.1016/j.actamat.2010.04.003
dc.identifier.volume58
dc.identifier.wos000279277500006
dc.language.isoen
dc.relation.ispartofActa Materialia
dc.rightsrestrictedAccess
dc.subjectMaterials science
dc.subjectVaristor
dc.subjectMicrostructure
dc.subjectElectron backscatter diffraction
dc.subjectTexture (cosmology)
dc.subjectComposite material
dc.subjectGrain boundary
dc.subjectAnisotropy
dc.subjectDiffraction
dc.subjectVoltage
dc.subjectOptics
dc.subjectElectrical engineering
dc.titleMicrostructure–property relationship in textured ZnO-based varistors
dc.typeArticle
dspace.entity.typePublication
local.authorid.openalexA5004923575
local.authorid.openalexA5042523767

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